Keyword 'Atomic Force Microscope' Publications

AFM and Van der Pauw Measurements of Carbon Nanoparticles Prepared from Kerosene

Author(s): Tanisha Mehreen, Jahirul Islam, Mohammad Abul Hossain, Khandker Saadat Hossain

Keywords: Carbon Nanoparticles, Atomic Force Microscope, Van Der Pauw, Rectifier, Thin Film

Abstract   References Volume 8 - Jun 2019 DOI: 10.18483/ijSci.2080

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Volume 13, June 2024


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